read_verilog << EOT module dffe_00( input clk, en, input d1, output reg q1, ); always @( negedge clk ) begin if ( ~en ) q1 <= d1; end endmodule module dffe_01( input clk, en, input d1, output reg q1, ); always @( negedge clk ) begin if ( en ) q1 <= d1; end endmodule module dffe_10( input clk, en, input d1, output reg q1, ); always @( posedge clk ) begin if ( ~en ) q1 <= d1; end endmodule module dffe_11( input clk, en, input d1, output reg q1, ); always @( posedge clk ) begin if ( en ) q1 <= d1; end endmodule module dffe_wide_11( input clk, en, input [3:0] d1, output reg [3:0] q1, ); always @( posedge clk ) begin if ( en ) q1 <= d1; end endmodule EOT proc opt design -save before #------------------------------------------------------------------------------ # Test -pos clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen # falling edge clock flops don't get matched on -pos select -module dffe_00 -assert-count 0 t:\\pdk_icg select -module dffe_01 -assert-count 0 t:\\pdk_icg # falling edge clock flops do get matched on -pos select -module dffe_10 -assert-count 1 t:\\pdk_icg select -module dffe_11 -assert-count 1 t:\\pdk_icg # if necessary, EN is inverted, since the given ICG # is assumed to have an active-high EN select -module dffe_10 -assert-count 1 t:\$_NOT_ select -module dffe_11 -assert-count 0 t:\$_NOT_ # Extra credit: multi-bit FFs work fine as well select -module dffe_wide_11 -assert-count 1 t:\\pdk_icg #------------------------------------------------------------------------------ # Test -neg design -load before clockgate -min_net_size 1 -neg pdk_icg ce:clkin:clkout -tie_lo scanen # rising edge clock flops don't get matched on -neg select -module dffe_00 -assert-count 1 t:\\pdk_icg select -module dffe_01 -assert-count 1 t:\\pdk_icg # rising edge clock flops do get matched on -neg select -module dffe_10 -assert-count 0 t:\\pdk_icg select -module dffe_11 -assert-count 0 t:\\pdk_icg # if necessary, EN is inverted, since the given ICG # is assumed to have an active-high EN select -module dffe_00 -assert-count 1 t:\$_NOT_ select -module dffe_01 -assert-count 0 t:\$_NOT_ #------------------------------------------------------------------------------ # Same as first case, but on fine-grained cells design -load before techmap clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen # falling edge clock flops don't get matched on -pos select -module dffe_00 -assert-count 0 t:\\pdk_icg select -module dffe_01 -assert-count 0 t:\\pdk_icg # falling edge clock flops do get matched on -pos select -module dffe_10 -assert-count 1 t:\\pdk_icg select -module dffe_11 -assert-count 1 t:\\pdk_icg # if necessary, EN is inverted, since the given ICG # is assumed to have an active-high EN select -module dffe_10 -assert-count 1 t:\$_NOT_ select -module dffe_11 -assert-count 0 t:\$_NOT_ # Extra credit: multi-bit FFs work fine as well select -module dffe_wide_11 -assert-count 1 t:\\pdk_icg #------------------------------------------------------------------------------ design -load before clockgate -min_net_size 2 -neg pdk_icg ce:clkin:clkout -tie_lo scanen # No FF set sharing a (clock, clock enable) pair is large enough select -module dffe_00 -assert-count 0 t:\\pdk_icg select -module dffe_01 -assert-count 0 t:\\pdk_icg select -module dffe_10 -assert-count 0 t:\\pdk_icg select -module dffe_11 -assert-count 0 t:\\pdk_icg #------------------------------------------------------------------------------ design -reset read_rtlil << EOT module \bad1 wire input 1 \clk wire input 3 \d1 wire input 2 \en wire output 4 \q1 cell $dffe $auto$ff.cc:266:slice$27 parameter \CLK_POLARITY 1 parameter \EN_POLARITY 1 parameter \WIDTH 1 connect \CLK \clk connect \D \d1 connect \EN 1'1 connect \Q \q1 end end module \bad2 wire input 1 \clk wire input 3 \d1 wire input 2 \en wire output 4 \q1 cell $dffe $auto$ff.cc:266:slice$27 parameter \CLK_POLARITY 1 parameter \EN_POLARITY 1 parameter \WIDTH 1 connect \CLK 1'1 connect \D \d1 connect \EN \en connect \Q \q1 end end EOT # Check we don't choke on constants clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen select -module bad1 -assert-count 0 t:\\pdk_icg select -module bad2 -assert-count 0 t:\\pdk_icg #------------------------------------------------------------------------------ # Regression test: EN is a bit from a multi-bit wire design -reset read_verilog << EOT module dffe_wide_11( input clk, input [1:0] en, input [3:0] d1, output reg [3:0] q1, ); always @( posedge clk ) begin if ( en[0] ) q1 <= d1; end endmodule EOT proc opt clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen select -assert-count 1 t:\\pdk_icg #------------------------------------------------------------------------------ # TODO test -tie_lo