yosys/tests/techmap/clockgate.ys

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read_verilog << EOT
module dffe_00( input clk, en,
input d1, output reg q1,
);
always @( negedge clk ) begin
if ( ~en )
q1 <= d1;
end
endmodule
module dffe_01( input clk, en,
input d1, output reg q1,
);
always @( negedge clk ) begin
if ( en )
q1 <= d1;
end
endmodule
module dffe_10( input clk, en,
input d1, output reg q1,
);
always @( posedge clk ) begin
if ( ~en )
q1 <= d1;
end
endmodule
module dffe_11( input clk, en,
input d1, output reg q1,
);
always @( posedge clk ) begin
if ( en )
q1 <= d1;
end
endmodule
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module dffe_wide_11( input clk, en,
input [3:0] d1, output reg [3:0] q1,
);
always @( posedge clk ) begin
if ( en )
q1 <= d1;
end
endmodule
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EOT
proc
opt
design -save before
#------------------------------------------------------------------------------
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# Test -pos
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clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen
# falling edge clock flops don't get matched on -pos
select -module dffe_00 -assert-count 0 t:\\pdk_icg
select -module dffe_01 -assert-count 0 t:\\pdk_icg
# falling edge clock flops do get matched on -pos
select -module dffe_10 -assert-count 1 t:\\pdk_icg
select -module dffe_11 -assert-count 1 t:\\pdk_icg
# if necessary, EN is inverted, since the given ICG
# is assumed to have an active-high EN
select -module dffe_10 -assert-count 1 t:\$_NOT_
select -module dffe_11 -assert-count 0 t:\$_NOT_
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# Extra credit: multi-bit FFs work fine as well
select -module dffe_wide_11 -assert-count 1 t:\\pdk_icg
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#------------------------------------------------------------------------------
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# Test -neg
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design -load before
clockgate -min_net_size 1 -neg pdk_icg ce:clkin:clkout -tie_lo scanen
# rising edge clock flops don't get matched on -neg
select -module dffe_00 -assert-count 1 t:\\pdk_icg
select -module dffe_01 -assert-count 1 t:\\pdk_icg
# rising edge clock flops do get matched on -neg
select -module dffe_10 -assert-count 0 t:\\pdk_icg
select -module dffe_11 -assert-count 0 t:\\pdk_icg
# if necessary, EN is inverted, since the given ICG
# is assumed to have an active-high EN
select -module dffe_00 -assert-count 1 t:\$_NOT_
select -module dffe_01 -assert-count 0 t:\$_NOT_
#------------------------------------------------------------------------------
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# Same as first case, but on fine-grained cells
design -load before
techmap
clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen
# falling edge clock flops don't get matched on -pos
select -module dffe_00 -assert-count 0 t:\\pdk_icg
select -module dffe_01 -assert-count 0 t:\\pdk_icg
# falling edge clock flops do get matched on -pos
select -module dffe_10 -assert-count 1 t:\\pdk_icg
select -module dffe_11 -assert-count 1 t:\\pdk_icg
# if necessary, EN is inverted, since the given ICG
# is assumed to have an active-high EN
select -module dffe_10 -assert-count 1 t:\$_NOT_
select -module dffe_11 -assert-count 0 t:\$_NOT_
# Extra credit: multi-bit FFs work fine as well
select -module dffe_wide_11 -assert-count 1 t:\\pdk_icg
#------------------------------------------------------------------------------
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design -load before
clockgate -min_net_size 2 -neg pdk_icg ce:clkin:clkout -tie_lo scanen
# No FF set sharing a (clock, clock enable) pair is large enough
select -module dffe_00 -assert-count 0 t:\\pdk_icg
select -module dffe_01 -assert-count 0 t:\\pdk_icg
select -module dffe_10 -assert-count 0 t:\\pdk_icg
select -module dffe_11 -assert-count 0 t:\\pdk_icg
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#------------------------------------------------------------------------------
design -reset
read_rtlil << EOT
module \bad1
wire input 1 \clk
wire input 3 \d1
wire input 2 \en
wire output 4 \q1
cell $dffe $auto$ff.cc:266:slice$27
parameter \CLK_POLARITY 1
parameter \EN_POLARITY 1
parameter \WIDTH 1
connect \CLK \clk
connect \D \d1
connect \EN 1'1
connect \Q \q1
end
end
module \bad2
wire input 1 \clk
wire input 3 \d1
wire input 2 \en
wire output 4 \q1
cell $dffe $auto$ff.cc:266:slice$27
parameter \CLK_POLARITY 1
parameter \EN_POLARITY 1
parameter \WIDTH 1
connect \CLK 1'1
connect \D \d1
connect \EN \en
connect \Q \q1
end
end
EOT
# Check we don't choke on constants
clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen
select -module bad1 -assert-count 0 t:\\pdk_icg
select -module bad2 -assert-count 0 t:\\pdk_icg
#------------------------------------------------------------------------------
# Regression test: EN is a bit from a multi-bit wire
design -reset
read_verilog << EOT
module dffe_wide_11( input clk, input [1:0] en,
input [3:0] d1, output reg [3:0] q1,
);
always @( posedge clk ) begin
if ( en[0] )
q1 <= d1;
end
endmodule
EOT
proc
opt
clockgate -pos pdk_icg ce:clkin:clkout -tie_lo scanen
select -assert-count 1 t:\\pdk_icg
#------------------------------------------------------------------------------
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# TODO test -tie_lo