From 49d6863641909c2f13f4c7d5f82c1a9281f8b602 Mon Sep 17 00:00:00 2001 From: tangxifan Date: Thu, 24 Sep 2020 17:33:14 -0600 Subject: [PATCH] [Architecture] Bug fix for scan-chain FF cell renaming --- openfpga_flow/VerilogNetlists/dff.v | 9 +++------ ...rac_N10_adder_register_scan_chain_40nm_openfpga.xml | 8 ++++---- ...adder_register_scan_chain_depop50_40nm_openfpga.xml | 6 +++--- ...egister_scan_chain_depop50_spypad_40nm_openfpga.xml | 10 +++++----- 4 files changed, 15 insertions(+), 18 deletions(-) diff --git a/openfpga_flow/VerilogNetlists/dff.v b/openfpga_flow/VerilogNetlists/dff.v index 25701e694..3e767d8c4 100644 --- a/openfpga_flow/VerilogNetlists/dff.v +++ b/openfpga_flow/VerilogNetlists/dff.v @@ -244,15 +244,14 @@ endmodule //End Of Module // - scan-chain input // - a scan-chain enable //----------------------------------------------------- -module SDFFSR ( +module SDFFSRQ ( input SET, // Set input input RST, // Reset input - input SE, // Scan-chain Enable - input SI, // Scan-chain input input CK, // Clock Input + input SE, // Scan-chain Enable input D, // Data Input + input SI, // Scan-chain input output Q, // Q output - output QN // QB output ); //------------Internal Variables-------- reg q_reg; @@ -272,10 +271,8 @@ end `ifndef ENABLE_FORMAL_VERIFICATION // Wire q_reg to Q assign Q = q_reg; - assign QN = ~q_reg; `else assign Q = 1'bZ; - assign QN = !Q; `endif endmodule //End Of Module diff --git a/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_40nm_openfpga.xml b/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_40nm_openfpga.xml index 9d1185882..41867db36 100644 --- a/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_40nm_openfpga.xml +++ b/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_40nm_openfpga.xml @@ -142,13 +142,13 @@ This is flip-flop with scan-chain feature. When the TESTEN is enabled, the data will be propagated form DI instead of D --> - + - - + + @@ -233,7 +233,7 @@ - + diff --git a/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_40nm_openfpga.xml b/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_40nm_openfpga.xml index 3303e65b8..1aa06737b 100644 --- a/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_40nm_openfpga.xml +++ b/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_40nm_openfpga.xml @@ -142,13 +142,13 @@ This is flip-flop with scan-chain feature. When the TESTEN is enabled, the data will be propagated form DI instead of D --> - + - + @@ -228,7 +228,7 @@ - + diff --git a/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_spypad_40nm_openfpga.xml b/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_spypad_40nm_openfpga.xml index df6418450..f288f47ef 100644 --- a/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_spypad_40nm_openfpga.xml +++ b/openfpga_flow/openfpga_arch/k6_frac_N10_adder_register_scan_chain_depop50_spypad_40nm_openfpga.xml @@ -142,13 +142,13 @@ This is flip-flop with scan-chain feature. When the TESTEN is enabled, the data will be propagated form DI instead of D --> - + - + @@ -243,7 +243,7 @@ - + @@ -278,7 +278,7 @@ - + @@ -311,7 +311,7 @@ - +